Sakaida, K., Oishi, K., Tahara, Y., Ohsuga, A., J, A. and Sei, Y. 2025. Federated Learning Algorithm to Suppress Occurrence of Low-Accuracy Devices. International Journal of Electrical and Computer Engineering Systems. 16, 8 (Sep. 2025), 607-620. DOI:https://doi.org/10.32985/ijeces.16.8.4.