Sakaida, K., K. Oishi, Y. Tahara, A. Ohsuga, A. J, and Y. Sei. “Federated Learning Algorithm to Suppress Occurrence of Low-Accuracy Devices”. International Journal of Electrical and Computer Engineering Systems, vol. 16, no. 8, Sept. 2025, pp. 607-20, doi:10.32985/ijeces.16.8.4.